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| LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LED ARRAY Pb Lead-Free Parts LA190B/UG-S6-PF DATA SHEET DOC. NO : REV. DATE : QW0905-LA190B/UG-S6-PF-08A01 A : 31 - Aug. - 2009 DCC LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 1/6 Package Dimensions 4.6 2.30.5 6.3 r 3.25 2.9 7.4 4.8 3.50.5 2.54TYP 4.550.5 + - LUG2641/L45-PF 2.9 3.1 3.3 4.3 1.5MAX 1/4 0.5 TYP 25.0MIN 1.0MIN 2.54TYP + - Note : 1.All dimension are in millimeter tolerance is O 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 2/6 Absolute Maximum Ratings at Ta=25 J Ratings Parameter Symbol Green Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V Electrostatic Discharge( * ) Operating Temperature Storage Temperature IF IFP PD Ir ESD Topr Tstg 25 75 65 10 2000 -40 ~ +85 -40 ~ +100 mA mA mW UNIT g A V J J Static Electricity or power surge will the Use of anti-electrosatic * glove is recommended when handingdamageLED.LED.devices, a conductive wrist band or must be properly these All equipment and machinery grounded. Typical Electrical & Optical Characteristics (Ta=25 J) PART NO MATERIAL Emitted COLOR Forward Dominant Spectral voltage wave halfwidth @20mA(V) length f nm f Dnm Luminous intensity @20mA(mcd) Viewing angle 2c 1/2 (deg) Lens Green Transparent Min. Max. 568 574 20 Min. Max. Min. Max. 1.7 2.6 220 550 40 LA190B/UG-S6-PF AlGaInP Green Note : 1.The forward voltage data did not including O 0.1V testing tolerance. 2. The luminous intensity data did not including O 15% testing tolerance. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 3/6 Brightness Code For Standard LED Lamps G CHIP Group A15 A16 A17 A18 Luminous Intensity(mcd) at 20 mA Min. 220 300 350 450 Max. 300 350 450 550 Color Code Group 7 8 9 Dominant Wave length(nm) at20 mA Min. 568 570 572 Max. 570 572 574 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 4/6 Typical Electro-Optical Characteristics Curve UG CHIP Fig.1 Forward current vs. Forward Voltage 60 Fig.2 Relative Intensity vs. Forward Current 2.0 Forward Current(mA) 50 40 30 20 10 0 0 0.5 1.0 1.5 2.0 2.5 3.0 Relative Intensity Normalize @20mA 1.0 0 1.0 10 100 1000 Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature Forward Current(mA) Fig.4 Relative Intensity vs. Temperature 1.2 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 Relative Intensity @20mA Normalize @25J Forward Voltage@20mA Normaliz @25J 2.5 2.0 1.5 1.0 0.5 0 -20 0 20 40 60 80 Ambient Temperature(J) Ambient Temperature(J) Fig.5 Relative Intensity vs. Wavelength Relative Intensity @20mA 1.0 0.5 0 500 550 600 650 Wavelength (nm) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 5/6 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max C Temperature 350XMax Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to case) 2.Wave Soldering Profile Dip Soldering C Preheat: 120XMax Preheat time: 60seconds Max Ramp-up C/sec(max) 2X C/sec(max) Ramp-Down:-5X C Solder Bath:260XMax Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to case) Temp(X C) 260X 3sec Max C 260X 5X /sec max 120X 2X /sec max Preheat 25X 0X 0 50 100 150 Time(sec) Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LA190B/UG-S6-PF Page 6/6 Reliability Test: Test Item Test Condition 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Description This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. Reference Standard MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 Operating Life Test High Temperature Storage Test 1.Ta=105 JO 5J 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 JO 5J 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. JIS C 7021: B-12 High Temperature High Humidity Test 1.Ta=65JO 5J 2.RH=90 %~95% 3.t=240hrs O 2hrs The purpose of this test is the resistance of the device under tropical for hours. MIL-STD-202:103B JIS C 7021: B-11 Thermal Shock Test 1.Ta=105 JO 5J&-40JO 5J (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 JO 5J 2.Dwell time= 10 O 1sec. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 JO 5J 2.Dwell time=5 O 1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 |
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